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Development of Trust Metrics for Quantifying Design Integrity and Error Implementation Cost

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자료유형E-Book
개인저자Kimura, Adam G.
단체저자명The Ohio State University. Electrical and Computer Engineering.
서명/저자사항Development of Trust Metrics for Quantifying Design Integrity and Error Implementation Cost.
발행사항[S.l.] : The Ohio State University., 2017
발행사항Ann Arbor : ProQuest Dissertations & Theses, 2017
형태사항150 p.
소장본 주기School code: 0168.
ISBN9780438091108
일반주기 Source: Dissertation Abstracts International, Volume: 79-10(E), Section: B.
Adviser: Steve Bibyk.
요약One of the major concerns in the Integrated Circuit (IC) industry today is the issue of Hardware Trust. This problem has risen as result of increased outsourcing and from the integration of more third party Intellectual Property (IP) into design
요약In this work, a Trust Metric Solution Space is defined in order to establish a roadmap for developing Trust Metrics. The Solution Space also creates a coalescing point for the metrics work being conducted in other communities to integrate into.
요약The EIC scoring is then used to assist in developing Test Articles (TA) for example case scenarios that contain embedded errors. A 32-bit Floating Point Adder, a Fixed to Floating Point Converter, a MIPS Processor, and a Full System TA was devel
요약Finally, future work and recommendations are made for continuing the progress this work has made. Recommendations for future work would involve exploring nonlinear distance measures to track deviation from the expected reference profile, as well
일반주제명Electrical engineering.
언어영어
기본자료 저록Dissertation Abstracts International79-10B(E).
Dissertation Abstract International
대출바로가기http://www.riss.kr/pdu/ddodLink.do?id=T15000202

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