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020 ▼a 9780438091108
035 ▼a (MiAaPQ)AAI10871330
035 ▼a (MiAaPQ)OhioLINK:osu1492607691591962
040 ▼a MiAaPQ ▼c MiAaPQ ▼d 248032
0491 ▼f DP
0820 ▼a 621.3
1001 ▼a Kimura, Adam G.
24510 ▼a Development of Trust Metrics for Quantifying Design Integrity and Error Implementation Cost.
260 ▼a [S.l.] : ▼b The Ohio State University., ▼c 2017
260 1 ▼a Ann Arbor : ▼b ProQuest Dissertations & Theses, ▼c 2017
300 ▼a 150 p.
500 ▼a Source: Dissertation Abstracts International, Volume: 79-10(E), Section: B.
500 ▼a Adviser: Steve Bibyk.
5021 ▼a Thesis (Ph.D.)--The Ohio State University, 2017.
520 ▼a One of the major concerns in the Integrated Circuit (IC) industry today is the issue of Hardware Trust. This problem has risen as result of increased outsourcing and from the integration of more third party Intellectual Property (IP) into design
520 ▼a In this work, a Trust Metric Solution Space is defined in order to establish a roadmap for developing Trust Metrics. The Solution Space also creates a coalescing point for the metrics work being conducted in other communities to integrate into.
520 ▼a The EIC scoring is then used to assist in developing Test Articles (TA) for example case scenarios that contain embedded errors. A 32-bit Floating Point Adder, a Fixed to Floating Point Converter, a MIPS Processor, and a Full System TA was devel
520 ▼a Finally, future work and recommendations are made for continuing the progress this work has made. Recommendations for future work would involve exploring nonlinear distance measures to track deviation from the expected reference profile, as well
590 ▼a School code: 0168.
650 4 ▼a Electrical engineering.
690 ▼a 0544
71020 ▼a The Ohio State University. ▼b Electrical and Computer Engineering.
7730 ▼t Dissertation Abstracts International ▼g 79-10B(E).
773 ▼t Dissertation Abstract International
790 ▼a 0168
791 ▼a Ph.D.
792 ▼a 2017
793 ▼a English
85640 ▼u http://www.riss.kr/pdu/ddodLink.do?id=T15000202 ▼n KERIS
980 ▼a 201812 ▼f 2019
990 ▼a 관리자 ▼b 관리자