가야대학교 분성도서관

상단 글로벌/추가 메뉴

회원 로그인

주메뉴

: • 전체검색; • 단행본; • 정기간행물; • 학위논문; • 비도서; • 특정번호 검색; • 기사색인; • 학습연구지원; • 지정도서

: • 전자자원통합검색; • 해외 WEB DB; • E-Book; • E-Learning; • 국내 WEB DB; • 인터넷검색

: • 대출현황조회/연장; • 예약현황조회/취소; • 희망도서; • 내서재; • 나의서평; • 나의태그; • 나의위젯; • RSS; • SDI; • 개인정보관리

: • 공지사항; • FAQ; • Q&A 일반·학술; • 신착/인기 도서; • 학위논문온라인제출; • 외부인 이용안내; • 설문조사

: • 도서관 소개; • 연혁; • 현황; • 이용안내; • 찾아오시는 길

자료검색

Home
상세정보

상세정보

검색결과 돌아가기

부가기능

MARC보기

A Logic Test Chip for Optimal Test and Diagnosis

상세 프로파일

상세정보
자료유형	E-Book
개인저자	Niewenhuis, Benjamin T.
단체저자명	Carnegie Mellon University. Electrical and Computer Engineering.
서명/저자사항	A Logic Test Chip for Optimal Test and Diagnosis.
발행사항	[S.l.] : Carnegie Mellon University., 2018
발행사항	Ann Arbor : ProQuest Dissertations & Theses, 2018
형태사항	127 p.
소장본 주기	School code: 0041.
ISBN	9780355971514
일반주기	Source: Dissertation Abstracts International, Volume: 79-09(E), Section: B. Adviser: Ronald Blanton.
이용제한사항	This item is not available from ProQuest Dissertations & Theses.
요약	The benefits of the continued progress in integrated circuit manufacturing have been numerous, most notably in the explosion of computing power in devices ranging from cell phones to cars. Key to this success has been strategies to identify, man
요약	To help address these challenges, a new logic test chip, called the Carnegie Mellon Logic Characterization Vehicle (CM-LCV), has been developed. The CM-LCV utilizes a two- dimensional array of functional unit blocks (FUBs) that each implement an
요약	In addition to the design of the CM-LCV, methods for testing it are presented. Techniques to create minimal sets of test patterns that exhaustively exercise each FUB within the FUB array are developed. Additional constraints are described for th
요약	A hierarchical FUB array diagnosis methodology (HFAD) is also presented for the CM-LCV that leverages its unique properties to improve performance for multiple defects. Experiments demonstrate that this HFAD methodology is capable of perfect acc
요약	The contributions of this dissertation can thus be summarized as the description of the design, test, and diagnosis of a new logic test chip for use in yield learning during process development. This CM-LCV can be adapted to meet a wide range of
일반주제명	Electrical engineering.
언어	영어
기본자료 저록	Dissertation Abstracts International79-09B(E). Dissertation Abstract International
대출바로가기	http://www.riss.kr/pdu/ddodLink.do?id=T14998477