| LDR | | 00000nmm u2200205 4500 |
| 001 | | 000000329726 |
| 005 | | 20241016150137 |
| 008 | | 181129s2018 ||| | | | eng d |
| 020 | |
▼a 9780355971514 |
| 035 | |
▼a (MiAaPQ)AAI10822479 |
| 035 | |
▼a (MiAaPQ)cmu:10255 |
| 040 | |
▼a MiAaPQ
▼c MiAaPQ
▼d 248032 |
| 049 | 1 |
▼f DP |
| 082 | 0 |
▼a 621.3 |
| 100 | 1 |
▼a Niewenhuis, Benjamin T. |
| 245 | 12 |
▼a A Logic Test Chip for Optimal Test and Diagnosis. |
| 260 | |
▼a [S.l.] :
▼b Carnegie Mellon University.,
▼c 2018 |
| 260 | 1 |
▼a Ann Arbor :
▼b ProQuest Dissertations & Theses,
▼c 2018 |
| 300 | |
▼a 127 p. |
| 500 | |
▼a Source: Dissertation Abstracts International, Volume: 79-09(E), Section: B. |
| 500 | |
▼a Adviser: Ronald Blanton. |
| 502 | 1 |
▼a Thesis (Ph.D.)--Carnegie Mellon University, 2018. |
| 506 | |
▼a This item is not available from ProQuest Dissertations & Theses. |
| 520 | |
▼a The benefits of the continued progress in integrated circuit manufacturing have been numerous, most notably in the explosion of computing power in devices ranging from cell phones to cars. Key to this success has been strategies to identify, man |
| 520 | |
▼a To help address these challenges, a new logic test chip, called the Carnegie Mellon Logic Characterization Vehicle (CM-LCV), has been developed. The CM-LCV utilizes a two- dimensional array of functional unit blocks (FUBs) that each implement an |
| 520 | |
▼a In addition to the design of the CM-LCV, methods for testing it are presented. Techniques to create minimal sets of test patterns that exhaustively exercise each FUB within the FUB array are developed. Additional constraints are described for th |
| 520 | |
▼a A hierarchical FUB array diagnosis methodology (HFAD) is also presented for the CM-LCV that leverages its unique properties to improve performance for multiple defects. Experiments demonstrate that this HFAD methodology is capable of perfect acc |
| 520 | |
▼a The contributions of this dissertation can thus be summarized as the description of the design, test, and diagnosis of a new logic test chip for use in yield learning during process development. This CM-LCV can be adapted to meet a wide range of |
| 590 | |
▼a School code: 0041. |
| 650 | 4 |
▼a Electrical engineering. |
| 690 | |
▼a 0544 |
| 710 | 20 |
▼a Carnegie Mellon University.
▼b Electrical and Computer Engineering. |
| 773 | 0 |
▼t Dissertation Abstracts International
▼g 79-09B(E). |
| 773 | |
▼t Dissertation Abstract International |
| 790 | |
▼a 0041 |
| 791 | |
▼a Ph.D. |
| 792 | |
▼a 2018 |
| 793 | |
▼a English |
| 856 | 40 |
▼u http://www.riss.kr/pdu/ddodLink.do?id=T14998477
▼n KERIS |
| 980 | |
▼a 201812
▼f 2019 |
| 990 | |
▼a 관리자
▼b 관리자 |