| 자료유형 | E-Book |
|---|---|
| 개인저자 | Sadi, Mehdi. |
| 단체저자명 | University of Florida. Electrical and Computer Engineering. |
| 서명/저자사항 | On-Chip Structures for Reliability Management of System-on-Chips. |
| 발행사항 | [S.l.] : University of Florida., 2017 |
| 발행사항 | Ann Arbor : ProQuest Dissertations & Theses, 2017 |
| 형태사항 | 130 p. |
| 소장본 주기 | School code: 0070. |
| ISBN | 9780438166943 |
| 일반주기 |
Source: Dissertation Abstracts International, Volume: 79-12(E), Section: B.
|
| 요약 | With aggressive technology scaling in the finfet era the transistor density per unit chip area has increased significantly over the past decade. As a result billion transistor complex System on Chips (SoC) that integrate multicore processors, me |
| 요약 | Increased functional density with shrinking technology could result in escalating PSN induced failures in the field. To address these issues, a fully digital on-chip distributed sensor network is presented to continuously monitor the PSN profile |
| 요약 | Because of process variation induced device and interconnect parametric shifts, the post-silicon critical or near-critical paths differ from those identified in the pre-silicon stage. As a result the operating speed or FMAX varies from sample t |
| 요약 | In this paper, a novel framework is presented for designing lifetime-reliable SoCs with self-adaptation capability against aging induced degradation. The proposed flow utilizes the existing Logic Built In Self Test (LBIST) hardware, and software |
| 일반주제명 | Computer engineering. Electrical engineering. |
| 언어 | 영어 |
| 기본자료 저록 | Dissertation Abstracts International79-12B(E). Dissertation Abstract International |
| 대출바로가기 | http://www.riss.kr/pdu/ddodLink.do?id=T15000787 |
인쇄
| No. | 등록번호 | 청구기호 | 소장처 | 도서상태 | 반납예정일 | 예약 | 서비스 | 매체정보 |
|---|---|---|---|---|---|---|---|---|
| 1 | WE00025695 | DP 621.3 | 가야대학교/전자책서버(컴퓨터서버)/ | 대출불가(별치) |
|