| LDR | | 02248nmm uu200409 4500 |
| 001 | | 000000331368 |
| 005 | | 20240805164238 |
| 008 | | 181129s2017 |||||||||||||||||c||eng d |
| 020 | |
▼a 9780438166943 |
| 035 | |
▼a (MiAaPQ)AAI10906700 |
| 040 | |
▼a MiAaPQ
▼c MiAaPQ
▼d 248032 |
| 082 | 0 |
▼a 621.3 |
| 100 | 1 |
▼a Sadi, Mehdi. |
| 245 | 10 |
▼a On-Chip Structures for Reliability Management of System-on-Chips. |
| 260 | |
▼a [S.l.] :
▼b University of Florida.,
▼c 2017 |
| 260 | 1 |
▼a Ann Arbor :
▼b ProQuest Dissertations & Theses,
▼c 2017 |
| 300 | |
▼a 130 p. |
| 500 | |
▼a Source: Dissertation Abstracts International, Volume: 79-12(E), Section: B. |
| 502 | 1 |
▼a Thesis (Ph.D.)--University of Florida, 2017. |
| 520 | |
▼a With aggressive technology scaling in the finfet era the transistor density per unit chip area has increased significantly over the past decade. As a result billion transistor complex System on Chips (SoC) that integrate multicore processors, me |
| 520 | |
▼a Increased functional density with shrinking technology could result in escalating PSN induced failures in the field. To address these issues, a fully digital on-chip distributed sensor network is presented to continuously monitor the PSN profile |
| 520 | |
▼a Because of process variation induced device and interconnect parametric shifts, the post-silicon critical or near-critical paths differ from those identified in the pre-silicon stage. As a result the operating speed or FMAX varies from sample t |
| 520 | |
▼a In this paper, a novel framework is presented for designing lifetime-reliable SoCs with self-adaptation capability against aging induced degradation. The proposed flow utilizes the existing Logic Built In Self Test (LBIST) hardware, and software |
| 590 | |
▼a School code: 0070. |
| 650 | 4 |
▼a Computer engineering. |
| 650 | 4 |
▼a Electrical engineering. |
| 690 | |
▼a 0464 |
| 690 | |
▼a 0544 |
| 710 | 20 |
▼a University of Florida.
▼b Electrical and Computer Engineering. |
| 773 | 0 |
▼t Dissertation Abstracts International
▼g 79-12B(E). |
| 773 | |
▼t Dissertation Abstract International |
| 790 | |
▼a 0070 |
| 791 | |
▼a Ph.D. |
| 792 | |
▼a 2017 |
| 793 | |
▼a English |
| 856 | 40 |
▼u http://www.riss.kr/pdu/ddodLink.do?id=T15000787
▼n KERIS |
| 980 | |
▼a 201812
▼f 2019 |
| 990 | |
▼a 관리자 |