자료유형 | E-Book |
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개인저자 | Dong, ZhiLi, author. |
서명/저자사항 | Fundamentals of crystallography, powder X-ray diffraction, and transmission electron microscopy for materials scientists /Dong ZhiLi. |
판사항 | First edition. |
발행예정일자 | 2204 |
형태사항 | 1 online resource. |
총서사항 | Advances in materials science and engineering |
소장본 주기 | OCLC control number change |
ISBN | 9780429351662 0429351666 9781000569889 1000569888 9781000569902 100056990X |
기타표준부호 | 10.1201/9780429351662doi |
서지주기 | Includes bibliographical references and index. |
요약 | "The goal of this textbook is to effectively equip readers with an in-depth understanding of crystallography, x-ray diffraction, and transmission electron microscopy theories as well as applications. Written as an introduction to the topic with minimal reliance on advanced mathematics, the book will appeal to a broad spectrum of readers, including students, engineers, and researchers in materials science and engineering, applied physics, and chemical engineering. It can be used in XRD and TEM lab training"-- |
일반주제명 | Materials -- Analysis. Crystallography. X-ray diffraction imaging. Transmission electron microscopy. Crystallography Mate?riaux -- Analyse. Cristallographie. Microscopie e?lectronique a? transmission. Crystallography. Materials -- Analysis. Transmission electron microscopy. X-ray diffraction imaging. SCIENCE / Solid State Physics SCIENCE / Spectroscopy & Spectrum Analysis TECHNOLOGY / Material Science |
언어 | 영어 |
기타형태 저록 | Print version:Dong, ZhiLi.Fundamentals of crystallography, powder X-ray diffraction, and transmission electron microscopy for materials scientistsFirst edition.Boca Raton, FL : CRC Press, 20229780367357948 |
대출바로가기 | https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=3218137 |
인쇄
No. | 등록번호 | 청구기호 | 소장처 | 도서상태 | 반납예정일 | 예약 | 서비스 | 매체정보 |
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1 | WE00023005 | 543 | 가야대학교/전자책서버(컴퓨터서버)/ | 대출가능 |