| LDR | | 04754cmm u22007938i 4500 |
| 001 | | 000000326910 |
| 003 | | OCoLC |
| 005 | | 20240307134532 |
| 006 | | m d |
| 007 | | cr ||||||||||| |
| 008 | | 211117s2022 flu ob 001 0 eng |
| 010 | |
▼a 2021056286 |
| 019 | |
▼a 1295618514
▼a 1313530181 |
| 020 | |
▼a 9780429351662
▼q (ebk) |
| 020 | |
▼a 0429351666 |
| 020 | |
▼a 9781000569889
▼q (electronic bk. : PDF) |
| 020 | |
▼a 1000569888
▼q (electronic bk. : PDF) |
| 020 | |
▼a 9781000569902
▼q (electronic bk. : EPUB) |
| 020 | |
▼a 100056990X
▼q (electronic bk. : EPUB) |
| 020 | |
▼z 9780367357948
▼q (hbk) |
| 020 | |
▼z 9781032246802
▼q (pbk) |
| 024 | 7 |
▼a 10.1201/9780429351662
▼2 doi |
| 035 | |
▼a 3218137
▼b (N$T) |
| 035 | |
▼a (OCoLC)1295611997
▼z (OCoLC)1295618514
▼z (OCoLC)1313530181 |
| 037 | |
▼a 9780429351662
▼b Taylor & Francis |
| 040 | |
▼a DLC
▼b eng
▼e rda
▼c DLC
▼d OCLCO
▼d OCLCF
▼d YDX
▼d TYFRS
▼d N$T
▼d 248032 |
| 042 | |
▼a pcc |
| 049 | |
▼a MAIN |
| 050 | 00 |
▼a QD131 |
| 072 | 7 |
▼a SCI
▼x 077000
▼2 bisacsh |
| 072 | 7 |
▼a SCI
▼x 078000
▼2 bisacsh |
| 072 | 7 |
▼a TEC
▼x 021000
▼2 bisacsh |
| 072 | 7 |
▼a PNT
▼2 bicssc |
| 082 | 00 |
▼a 543
▼2 23/eng20220207 |
| 100 | 1 |
▼a Dong, ZhiLi,
▼e author. |
| 245 | 10 |
▼a Fundamentals of crystallography, powder X-ray diffraction, and transmission electron microscopy for materials scientists /
▼c Dong ZhiLi. |
| 250 | |
▼a First edition. |
| 263 | |
▼a 2204 |
| 264 | 1 |
▼a Boca Raton, FL :
▼b CRC Press,
▼c 2022. |
| 300 | |
▼a 1 online resource. |
| 336 | |
▼a text
▼b txt
▼2 rdacontent |
| 337 | |
▼a computer
▼b c
▼2 rdamedia |
| 338 | |
▼a online resource
▼b cr
▼2 rdacarrier |
| 490 | 0 |
▼a Advances in materials science and engineering |
| 504 | |
▼a Includes bibliographical references and index. |
| 520 | |
▼a "The goal of this textbook is to effectively equip readers with an in-depth understanding of crystallography, x-ray diffraction, and transmission electron microscopy theories as well as applications. Written as an introduction to the topic with minimal reliance on advanced mathematics, the book will appeal to a broad spectrum of readers, including students, engineers, and researchers in materials science and engineering, applied physics, and chemical engineering. It can be used in XRD and TEM lab training"--
▼c Provided by publisher. |
| 545 | 0 |
▼a Dr. ZhiLi Dong received his B.Eng. degree in metallic materials engineering from Tsinghua University in 1984. Dong obtained his Ph.D. degree from Tsinghua University in 1989 under the Joint Ph.D. Program of the Ministry of Education of China. Dong received the Japanese Government Scholarship and carried out his PhD research at Osaka University in 1987 and 1988. Dong developed his research in the areas of materials engineering, synthesis of geo-mimetic materials, crystal structure/electronic structure-property relationships, and interface structure analysis. He has more than thirty years' experience in x-ray diffraction and transmission electron microscopy of materials. Dong is an Associate Professor in the School of Materials Science & Engineering of Nanyang Technological University. Prior to joining NTU, Dong worked at the Environmental Technology Institute of Singapore as a senior research scientist, School of Mechanical and Production Engineering of NTU as a research fellow, University of Barcelona as a visiting professor, and Tsinghua University as a lecturer. |
| 588 | |
▼a Description based on print version record and CIP data provided by publisher; resource not viewed. |
| 590 | |
▼a OCLC control number change |
| 650 | 0 |
▼a Materials
▼x Analysis. |
| 650 | 0 |
▼a Crystallography. |
| 650 | 0 |
▼a X-ray diffraction imaging. |
| 650 | 0 |
▼a Transmission electron microscopy. |
| 650 | 2 |
▼a Crystallography |
| 650 | 6 |
▼a Mate?riaux
▼x Analyse. |
| 650 | 6 |
▼a Cristallographie. |
| 650 | 6 |
▼a Microscopie e?lectronique a? transmission. |
| 650 | 7 |
▼a Crystallography.
▼2 fast
▼0 (OCoLC)fst00884652 |
| 650 | 7 |
▼a Materials
▼x Analysis.
▼2 fast
▼0 (OCoLC)fst01011773 |
| 650 | 7 |
▼a Transmission electron microscopy.
▼2 fast
▼0 (OCoLC)fst01154860 |
| 650 | 7 |
▼a X-ray diffraction imaging.
▼2 fast
▼0 (OCoLC)fst02003111 |
| 650 | 7 |
▼a SCIENCE / Solid State Physics
▼2 bisacsh |
| 650 | 7 |
▼a SCIENCE / Spectroscopy & Spectrum Analysis
▼2 bisacsh |
| 650 | 7 |
▼a TECHNOLOGY / Material Science
▼2 bisacsh |
| 655 | 4 |
▼a Electronic books. |
| 776 | 08 |
▼i Print version:
▼a Dong, ZhiLi.
▼t Fundamentals of crystallography, powder X-ray diffraction, and transmission electron microscopy for materials scientists
▼b First edition.
▼d Boca Raton, FL : CRC Press, 2022
▼z 9780367357948
▼w (DLC) 2021056285 |
| 856 | 40 |
▼3 EBSCOhost
▼u https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=3218137 |
| 938 | |
▼a EBSCOhost
▼b EBSC
▼n 3218137 |
| 990 | |
▼a 관리자 |
| 994 | |
▼a 92
▼b N$T |