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Characterisation and Control of Defects in Semiconductors /
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| 자료유형 | E-Book |
|---|---|
| 개인저자 | Tuomisto, Filip, editor. |
| 서명/저자사항 | Characterisation and Control of Defects in Semiconductors /edited by Filip Tuomisto. |
| 발행사항 | Stevenage : The Institution of Engineering and Technology, 2019. |
| 형태사항 | 1 online resource (596 pages). |
| 총서사항 | IET Materials, Circuits & Devices Series ;45 |
| 소장본 주기 | Master record variable field(s) change: 050 |
| ISBN | 1785616560 9781785616563 |
| 요약 | The following topics are dealt with: semiconductor defect control; semiconductor doping; ion beam effects; ion implantation; elemental semiconductors; silicon; electrically active defects; point defect luminescence; vibrational spectroscopy; magnetic resonance methods; muons; positron annihilation spectroscopy; first principles methods; microscopy; 3D atomic-scale studies; ion beam modification; and ion beam analysis and channelling. |
| 일반주제명 | Ion implantation. Magnetic resonance. Semiconductor doping. Semiconductors -- Materials. Silicon. Ion implantation. Magnetic resonance. Semiconductor doping. Semiconductors -- Materials. Silicon. crystal defects. ion beam effects. ion implantation. luminescence. magnetic resonance. microscopy. positron annihilation. semiconductor doping. semiconductor materials. silicon. |
| 언어 | 영어 |
| 대출바로가기 | http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=2345949 |
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|---|---|---|---|---|---|---|---|---|
| 1 | WE00018398 | 621.38152 | 가야대학교/전자책서버(컴퓨터서버)/ | 대출가능 |
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