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020 ▼a 9780438173323
035 ▼a (MiAaPQ)AAI10784977
035 ▼a (MiAaPQ)washington:18388
040 ▼a MiAaPQ ▼c MiAaPQ ▼d 248032
0491 ▼f DP
0820 ▼a 620.5
1001 ▼a Esfahani, Ehsan Nasr.
24510 ▼a Developing Advanced Atomic Force Microscopy Techniques for Probing Coupled Phenomena in Functional Materials.
260 ▼a [S.l.] : ▼b University of Washington., ▼c 2018
260 1 ▼a Ann Arbor : ▼b ProQuest Dissertations & Theses, ▼c 2018
300 ▼a 153 p.
500 ▼a Source: Dissertation Abstracts International, Volume: 79-12(E), Section: B.
500 ▼a Adviser: Jiangyu Li.
5021 ▼a Thesis (Ph.D.)--University of Washington, 2018.
520 ▼a In the last decades, nanotechnology has built great expectations because of its unique capabilities in engineering materials with tailored properties. Exhibiting enhanced physical and chemical properties at length scale on the order of 1{10 nm,
520 ▼a Atomic Force Microscope (AFM) is a versatile tool for imaging, measurements, and manipulation of matter with nanometer spatial resolution and picometer detection accuracy. Over the last three decades, advanced AFM modes and functionalized probes
520 ▼a The first goal of this dissertation was to develop advanced excitation, detection, and data analysis techniques that can measure nonlinear phenomena, resolve topographic and feedback cross-talks, and extract intrinsic properties. A multi-harmoni
520 ▼a The second part of the dissertation deals with novel AFM imaging modes on the foundation of excitation and detection schemes explained in the previous part. Currently, the state-of-the-art AFM imaging modes used to characterize ferroelectric and
590 ▼a School code: 0250.
650 4 ▼a Nanoscience.
650 4 ▼a Applied physics.
650 4 ▼a Materials science.
690 ▼a 0565
690 ▼a 0215
690 ▼a 0794
71020 ▼a University of Washington. ▼b Aeronautics and Astronautics.
7730 ▼t Dissertation Abstracts International ▼g 79-12B(E).
773 ▼t Dissertation Abstract International
790 ▼a 0250
791 ▼a Ph.D.
792 ▼a 2018
793 ▼a English
85640 ▼u http://www.riss.kr/pdu/ddodLink.do?id=T14997295 ▼n KERIS
980 ▼a 201812 ▼f 2019
990 ▼a 관리자 ▼b 관리자