| LDR | | 03417cmm u2200505Ii 4500 |
| 001 | | 000000313441 |
| 003 | | OCoLC |
| 005 | | 20230525154612 |
| 006 | | m d |
| 007 | | cr c|||||||||| |
| 008 | | 180617t20182018dcua ob 000 0 eng d |
| 020 | |
▼a 9780309470827
▼q (electronic bk.) |
| 020 | |
▼a 030947082X
▼q (electronic bk.) |
| 020 | |
▼z 9780309470797 |
| 020 | |
▼z 030947079X |
| 035 | |
▼a 1841442
▼b (N$T) |
| 035 | |
▼a (OCoLC)1040689141 |
| 040 | |
▼a CUS
▼b eng
▼e rda
▼e pn
▼c CUS
▼d EBLCP
▼d N$T
▼d 248032 |
| 049 | |
▼a MAIN |
| 050 | 4 |
▼a QC476.S6 |
| 072 | 7 |
▼a SCI
▼x 057000
▼2 bisacsh |
| 082 | 04 |
▼a 539.2
▼2 23 |
| 110 | 2 |
▼a National Academies of Sciences, Engineering, and Medicine (U.S.).
▼b Committee on Space Radiation Effects Testing Infrastructure for the U.S. Space Program,
▼e author. |
| 245 | 10 |
▼a Testing at the speed of light :
▼b the state of U.S. electronic parts space radiation testing infrastructure /
▼c Committee on Space Radiation Effects Testing Infrastructure for the U.S. Space Program, National Materials and Manufacturing Board, Division on Engineering and Physical Sciences, the National Academies of Sciences, Engineering, Medicine. |
| 260 | |
▼a Washington, DC :
▼b the National Academies Press,
▼c [2018]. |
| 300 | |
▼a 1 online resource (xii, 76 pages) :
▼b color illustrations |
| 336 | |
▼a text
▼b txt
▼2 rdacontent |
| 337 | |
▼a computer
▼b c
▼2 rdamedia |
| 338 | |
▼a online resource
▼b cr
▼2 rdacarrier |
| 490 | 1 |
▼a A consensus study report of the National Academies of Sciences, Engineering, Medicine |
| 504 | |
▼a Includes bibliographical references. |
| 505 | 0 |
▼a Summary -- Introduction -- The space radiation environment and its effect on electronics -- Current state of single-event effects hardness assurance and infrastructure --Future infrastructure needs -- A path towards the future -- Appendixes |
| 520 | |
▼a "Spacecraft depend on electronic components that must perform reliably over missions measured in years and decades. Space radiation is a primary source of degradation, reliability issues, and potentially failure for these electronic components. Although simulation and modeling are valuable for understanding the radiation risk to microelectronics, there is no substitute for testing, and an increased use of commercial-off-the- shelf parts in spacecraft may actually increase requirements for testing, as opposed to simulation and modeling. Testing at the Speed of Light evaluates the nation's current capabilities and future needs for testing the effects of space radiation on microelectronics to ensure mission success and makes recommendations on how to provide effective stewardship of the necessary radiation test infrastructure for the foreseeable future"--Publisher's description |
| 588 | 0 |
▼a Online resource; title from PDF title page (National Academies Press, viewed June 11, 2018). |
| 590 | |
▼a Master record variable field(s) change: 072, 082 |
| 650 | 0 |
▼a Radiation sources
▼x Measurement. |
| 650 | 0 |
▼a Extraterrestrial radiation
▼x Safety measures. |
| 650 | 0 |
▼a Space flight
▼x Safety measures. |
| 650 | 7 |
▼a SCIENCE / Physics / Quantum Theory.
▼2 bisacsh |
| 655 | 4 |
▼a Electronic books. |
| 830 | 0 |
▼a Consensus study report. |
| 856 | 40 |
▼3 EBSCOhost
▼u http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=1841442 |
| 938 | |
▼a EBL - Ebook Library
▼b EBLB
▼n EBL5430372 |
| 938 | |
▼a EBSCOhost
▼b EBSC
▼n 1841442 |
| 990 | |
▼a 관리자 |
| 994 | |
▼a 92
▼b N$T |