자료유형 | E-Book |
---|---|
개인저자 | Krishnan, Kannan M., author. |
서명/저자사항 | Principles of materials characterization and metrology /Kannan M. Krishnan. |
판사항 | First edition. |
형태사항 | 1 online resource (xx, 846 pages) : illustrations. |
소장본 주기 | WorldCat record variable field(s) change: 050 |
ISBN | 9780192566089 0192566083 |
서지주기 | Includes bibliographical references and index. |
요약 | "Characterization enables a microscopic understanding of the fundamental properties of materials (Science) to predict their macroscopic behaviour (Engineering). With this focus, Principles of Materials Characterization and Metrology presents a comprehensive discussion of the principles of materials characterization and metrology. Characterization techniques are introduced through elementary concepts of bonding, electronic structure of molecules and solids, and the arrangement of atoms in crystals. Then, the range of electrons, photons, ions, neutrons and scanning probes, used in ch.aracterization, including their generation and related beam-solid interactions that determine or limit their use, is presented. This is followed by ion-scattering methods, optics, optical diffraction, microscopy, and ellipsometry. Generalization of Fraunhofer diffraction to scattering by a three-dimensional arrangement of atoms in crystals leads to X-ray, electron, and neutron diffraction methods, both from surfaces and the bulk. Discussion of transmission and analytical electron microscopy, including recent developments, is followed by chapters on scanning electron microscopy and scanning probe microscopies. The book concludes with elaborate tables to provide a convenient and easily accessible way of summarizing the key points, features, and inter-relatedness of the different spectroscopy, diffraction, and imaging techniques presented throughout. Principles of Materials Characterization and Metrology uniquely combines a discussion of the physical principles and practical application of these characterization techniques to explain and illustrate the fundamental properties of a wide range of materials in a tool-based approach. Based on forty years of teaching and research, this book incorporates worked examples, to test the reader's knowledge with extensive questions and exercises."-- |
일반주제명 | Materials -- Analysis. Materials -- Analysis. |
언어 | 영어 |
기타형태 저록 | Print version:Krishnan, Kannan M.Principles of Materials Characterization and MetrologyOxford : Oxford University Press USA - OSO,c20219780198830252 |
대출바로가기 | https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=2917834 |
인쇄
No. | 등록번호 | 청구기호 | 소장처 | 도서상태 | 반납예정일 | 예약 | 서비스 | 매체정보 |
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1 | WE00022694 | 620.112 | 가야대학교/전자책서버(컴퓨터서버)/ | 대출가능 |